| CODICE | 94837 |
|---|---|
| ANNO ACCADEMICO | 2018/2019 |
| CFU | 3 cfu al 2° anno di 9017 SCIENZA E INGEGNERIA DEI MATERIALI (LM-53) GENOVA |
| SETTORE SCIENTIFICO DISCIPLINARE | FIS/03 |
| LINGUA | Inglese |
| SEDE | GENOVA (SCIENZA E INGEGNERIA DEI MATERIALI ) |
| PERIODO | 1° Semestre |
| MODULI | Questo insegnamento è un modulo di: |
| MATERIALE DIDATTICO | AULAWEB |
Acquire the basic knowledge of X-ray powder diffraction techniques, through practical activities aimed at interpreting diffraction data. Knowledge of the instrumentation and operational techniques for compositional and structural analyses.
Powder diffraction techniques. Interpretation of diffraction data from polycrystalline samples: phase identification, indexing methods, structure refinement by the Rietveld method. Introduction to surface sensitive techniques based on electron and photon beams. The Ultra High Vacuum Environment. Low energy electron diffraction (LEED) and grazing angle X-ray diffraction (GISAX). X-Ray photoemission spectroscopy (XPS). Auger electron spectroscopy (AES). Fluorescence. Photoelectron diffraction. EXAFS and NEXAFS. Synchrotron radiation and its sources.
V. K. Pecharsky, P. Y. Zavalij “Fundamentals of powder diffraction and structural characterization of materials” Kluwer Academic Press International Tables of Crystallography Vols.1-4
MARCELLA PANI (Presidente)
LETIZIA SAVIO (Presidente)