OVERVIEW

Understanding the fundamentals of microscopy techniques and interrelated spectroscopies  in the investigation of  materials.

AIMS AND CONTENT

LEARNING OUTCOMES

Understanding the fundamentals of electron microscopies and energy dispersive x-ray spectroscopy, which permit the observation and characterization of heterogeneous organic and inorganic materials.

TEACHING METHODS

Lectures + lab sessions

SYLLABUS/CONTENT

Scanning electron microscopy and microprobe: electron optics, electron beam - specimen interaction, signal detection, image formation, contrast types. EDX and WDX spectroscopy; qualitative and quantitative x-ray analysis.

Transmission electron microscopy: elastic and inelastic scattering phenomena. The microscope: the illumination system, the objective lens and stage, the imaging system. Introduction to the different types of contrast. Introduction to electron diffraction. Sample preparation techniques.

RECOMMENDED READING/BIBLIOGRAPHY

“Scanning Electron Microscopy and X-ray Microanalysis”, J.I. Goldstein, D.E. Newbury, P. Echlin, D.C. Joy, A.D. Romig, Jr., C.E. Lyman, C. Fiori, E. Lifshin, Plenum Press, 1992.

“Trasmission Electron Microscopy”, D.B. Williams and C.B. Carter, Plenum Press, 1996.

TEACHERS AND EXAM BOARD

LESSONS

LESSONS START

Second semester

Class schedule

The timetable for this course is available here: Portale EasyAcademy

EXAMS

EXAM DESCRIPTION

Written exam lasting 2 hours with open questions.

ASSESSMENT METHODS

Student have to answer to some questions on the topics covered in the course.

Five questions will be proposed: 3 on SEM and 2 on TEM.

The student must answer 2 of the 3 questions on the SEM and 1 of the 2 questions on the TEM.

Exam schedule